The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Aug. 02, 2012
John G. Michopoulos, Washington, DC (US);
Athanasios Iliopoulos, Chevy Chase, MD (US);
Nikos P. Andrianopoulos, Athens, GR;
John G. Michopoulos, Washington, DC (US);
Athanasios Iliopoulos, Chevy Chase, MD (US);
Nikos P. Andrianopoulos, Athens, GR;
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A method and system for measuring full field deformation characteristics in three dimensions of a body upon which a pattern of visible marks has been applied. The method includes receiving images of the pattern of marks from at least two digital video cameras as the specimen deforms. A computer processor identifies the centroids of each of the two camera images of the body in a first frame, matches the centroids of the marks in the two images, and generates a three-dimensional representation of the centroids based on the two images, and repeats these steps for the images from the two cameras in a subsequent frame. The computer processor calculates the displacement vector between a three dimensional representation of the centroids and the subsequent three dimensional representation of the centroids, and calculates full field displacement and strain fields based on the displacement vector.