The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2015

Filed:

Dec. 29, 2011
Applicants:

Pekka Typpo, Pearland, TX (US);

Willy Knabe, Heidenheim, DE;

Jörg Bröckel, Gerstetten, DE;

Inventors:

Pekka Typpo, Pearland, TX (US);

Willy Knabe, Heidenheim, DE;

Jörg Bröckel, Gerstetten, DE;

Assignee:

Voith Patent GmbH, Heidenheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/84 (2006.01); G01B 11/06 (2006.01); D21F 7/06 (2006.01); G01B 7/06 (2006.01); G01B 21/08 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0691 (2013.01); D21F 7/06 (2013.01); G01B 7/107 (2013.01); G01B 21/08 (2013.01); G01B 2210/44 (2013.01);
Abstract

A method for the contactless determination of the thickness of a web of material, for example a web of fibrous material using a sensor array including at least two optical measurement units between which the web can be guided. Each of the optical measurement units includes a measurement plate on the side facing the web. The optical measurement units, which are arranged on opposite sides of the web, are used to measure the distance of the measurement units from the web, and an evaluation unit is used to determine the thickness of the web from the determined distances between the optical measurement units and the web and the distance between the optical measurement units arranged on opposite sides of the web.


Find Patent Forward Citations

Loading…