The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Dec. 05, 2013
Canon Kabushiki Kaisha, Tokyo, JP;
Takeshi Murase, Yokohama, JP;
Masao Kato, Kawasaki, JP;
Shigeyasu Nagoshi, Yokohama, JP;
Minako Kato, Kawasaki, JP;
Minoru Teshigawara, Saitama, JP;
Yoshiaki Murayama, Tokyo, JP;
Susumu Hirosawa, Tokyo, JP;
Yutaka Kano, Yokohama, JP;
Satoshi Azuma, Kawasaki, JP;
Kentarou Muro, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A process of detecting a defective recording element and a process of correcting the defective recording element are performed with appropriate processing loads. When the detection process and the correction processes are performed with small loads, for example, at a time of recording, a resolution used for reading an inspection pattern is set lower than that set in a case where the processes can be performed with small loads, for example, at down time before recording. The reading resolution to be set may be determined by an apparatus in accordance with a processing load or may be arbitrarily determined by a user.