The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Sep. 14, 2012
Applicants:
James Z. Liu, Belvidere, IL (US);
Donald K. Landphair, Bettendorf, IA (US);
Inventors:
James Z. Liu, Belvidere, IL (US);
Donald K. Landphair, Bettendorf, IA (US);
Assignee:
DEERE & COMPANY, Moline, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01C 7/04 (2006.01); A01C 7/12 (2006.01); A01C 19/02 (2006.01); A01C 7/08 (2006.01); A01C 7/10 (2006.01); A01C 7/20 (2006.01);
U.S. Cl.
CPC ...
A01C 7/081 (2013.01); A01C 7/082 (2013.01); A01C 7/044 (2013.01); A01C 7/105 (2013.01); A01C 7/084 (2013.01); A01C 7/125 (2013.01); A01C 7/127 (2013.01); A01C 19/02 (2013.01); A01C 7/206 (2013.01); A01C 7/107 (2013.01);
Abstract
A system and method of calibrating a meter of a product distribution machine, such as an agricultural air seeder is shown. The system uses one or both of optical and mass flow sensors to measure the product flow rate. The sensors are used to measure mass flow rate during a calibration process while the machine is in use. To improve sensor accuracy during the calibration process, the meter speed is changed to change the product flow rate to a rate at which the sensor accuracy is increased.