The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
May. 08, 2012
Michael S. Fulton, Maple Ridge, CA;
Shirish T. Shenvi Kuncolienkar, Bangalore, IN;
Michael S. Fulton, Maple Ridge, CA;
Shirish T. Shenvi Kuncolienkar, Bangalore, IN;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
View definitions are created for deterministic performance analysis in real-time computing systems, and can then be used to present views for analyzing outliers that occur during run-time execution. Trace data created by a real-time application is compared to a set of view definitions to determine whether the trace data matches the view definition. If so, then related records from the trace are gathered according to specifications in the matched view definition, and calculations (such as elapsed time) can then be performed using the related records. A view definition may be created by prompting a user for selection of parameters to be programmatically inserted into a markup language document. A capability may be provided whereby a user can receive additional information (which is extracted from the trace data, according to specifications in the matched view definition) upon a user gesture such as hovering a selection means over a displayed view.