The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Jan. 23, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

William V. Huott, Holmes, NY (US);

Kevin W. Kark, Poughkeepsie, NY (US);

John G. Massey, Jericho, VT (US);

K. Paul Muller, Wappinger Falls, NY (US);

David L. Rude, Wendell, NC (US);

David S. Wolpert, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/29 (2006.01); H03M 13/05 (2006.01);
U.S. Cl.
CPC ...
H03M 13/2909 (2013.01); H03M 13/29 (2013.01); H03M 13/05 (2013.01);
Abstract

A method for providing error detection and/or correction to an array of storage cells includes determining a sensitive direction and an insensitive direction of the storage cells and adding a first error control mechanism to the array of storage cells in the insensitive direction. The method also includes adding a second error control mechanism to the array of storage cells in the sensitive direction. The second error control mechanism has a higher Hamming distance than the first error control mechanism.


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