The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Jan. 02, 2013
Applicant:

Tata Consultancy Services Limited, Mumbai, Maharashtra, IN;

Inventors:

Vaishali Sadaphal, Pune, IN;

Maitreya Natu, Pune, IN;

Harrick Vin, Pune, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0709 (2013.01); G06F 11/079 (2013.01); G06F 11/3093 (2013.01); G06F 11/3419 (2013.01); G06F 2201/81 (2013.01);
Abstract

Systems and Methods for detection and localization of performance faults in data centers are described. In one embodiment, a method comprises identifying a performance fault in a data center upon detection of the performance fault at any of a plurality of monitors in the data center, wherein the plurality of monitors are placed at monitor nodes, amongst a plurality of nodes, in the data center. Further, the method comprises evaluating a fault vector for the data center upon identification of the performance fault, wherein the fault vector is evaluated based on a fault indicator corresponding to each of the plurality of monitors. Based on the comparison of the fault vector with signatures of each of the plurality of nodes, one or more faulty nodes, amongst the plurality of nodes in the data center, are determined as likely root cause of the performance fault.


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