The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Apr. 26, 2011
Ryohei Fujimaki, Tokyo, JP;
Hidenori Tsukahara, Tokyo, JP;
Ryohei Fujimaki, Tokyo, JP;
Hidenori Tsukahara, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A malfunction analysis apparatus () is provided with a malfunction-analysis processor (), an attribute-extraction processor (), and an outputter (). The malfunction-analysis processor () obtains a malfunction-contribution degree, which indicates a degree that individual malfunctions (to be called malfunctioning elements, hereafter) contribute to the malfunctioning of the object being analyzed, on the basis of the relative relationship between the data to be analyzed that has, as elements thereof, values generated on the basis of a plurality of indicator values of the object being analyzed, and representative values for the plurality of indicators corresponding to each of the plurality of malfunctions. Then, the malfunctioning elements being generated is specified, on the basis of the obtained malfunction-contribution degree. The attribute-extraction processor () specifies, when a malfunctioning is taking place that is a combination of the malfunctioning elements, the indicators that are estimated as the cause of the specified malfunctioning elements, on the basis of the representative values of the plurality of indicators, and the values of each of the elements of the data to be analyzed that was stored. The outputter () outputs the specified malfunctioning elements and/or the indicators.