The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Jun. 09, 2010
Applicants:

András Kern, Budapest, HU;

Attila Takács, Budapest, HU;

Inventors:

András Kern, Budapest, HU;

Attila Takács, Budapest, HU;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/177 (2006.01); H04L 12/26 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 43/12 (2013.01); H04L 43/00 (2013.01); H04L 41/084 (2013.01); H04L 41/5009 (2013.01); H04L 41/5077 (2013.01);
Abstract

An example method transmits a path message to an egress node, via intermediate nodes, that configures OAM monitoring of an entire connection between an ingress node and the egress node and also configures OAM monitoring of at least one segment of the connection shorter than the entire connection by at least one intermediate node. The path message comprises a LSP attributes object and an ERO. The LSP object comprises technology-specific attributes defining descriptors for configuring the egress node in accordance with a communication protocol utilized for the connection; and technology-independent OAM parameters that, irrespective of the communication protocol, define an OAM type to be used by the egress node, and define desired monitoring actions for the egress node to perform. The ERO comprises a respective HOP Attributes sub-object for configuring each of the at least one intermediate nodes. Each HOP Attributes sub-object also comprises technology-specific attributes and technology-independent OAM parameters.


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