The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Jun. 13, 2013
Applicant:

Amazon Technologies, Inc., Reno, NV (US);

Inventors:

John David Dunagan, Redmond, WA (US);

Derek Solomon Pai, Seattle, WA (US);

Caitlyn Rose Shim, Seattle, WA (US);

John W. Heitmann, Seattle, WA (US);

Michael R. Foster, Issaquah, WA (US);

Assignee:

Amazon Technologies, Inc., Reno, NV (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30371 (2013.01);
Abstract

Pivot queries can be performed using stored monitoring data. Pivot queries can be received. Monitoring data can be read from data files. Each data file can store monitoring data for a plurality of tenants. The read monitoring data can be aggregated based on metric types across various dimensions, according to the pivot queries. Results can be presented in various formats, such as charts and graphs. Reading, aggregating, and presenting results can be performed within a multi-tenant monitoring system.


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