The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Jan. 30, 2012
Donald Coolidge Wunsch, Ii, Rolla, MO (US);
Rui Xu, Clifton Park, NY (US);
Sejun Kim, Rolla, MO (US);
Donald Coolidge Wunsch, II, Rolla, MO (US);
Rui Xu, Clifton Park, NY (US);
Sejun Kim, Rolla, MO (US);
The Curators of the University of Missouri, Columbia, MO (US);
Abstract
Methods and systems for improved unsupervised learning are described. The unsupervised learning can consist of biclustering a data set, e.g., by biclustering subsets of the entire data set. In an example, the biclustering does not include feeding know and proven results into the biclustering methodology or system. A hierarchical approach can be used that feeds proven clusters back into the biclustering methodology or system as the input. Data that does not cluster may be discarded. Thus, a very large unknown data set can be acted on to learn about the data. The system is also amenable to parallelization.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile