The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Sep. 13, 2012
Ryohei Fujimaki, Minato-ku, JP;
Satoshi Morinaga, Minato-ku, JP;
Ryohei Fujimaki, Minato-ku, JP;
Satoshi Morinaga, Minato-ku, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
To provide a latent variable model estimation apparatus capable of implementing the model selection at high speed even if the number of model candidates increases exponentially as the latent state number and the kind of the observation probability increase. A variational probability calculating unitcalculates a variational probability by maximizing a reference value that is defined as a lower bound of an approximation amount, in which Laplace approximation of a marginalized log likelihood function is performed with respect to an estimator for a complete variable. A model estimation unitestimates an optimum latent variable model by estimating the kind and a parameter of the observation probability with respect to each latent state. A convergence determination unitdetermines whether a reference value, which is used by the variational probability calculating unitto calculate the variational probability, converges.