The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Nov. 30, 2011
Takahumi Oowada, Kariya, JP;
Takahumi Oowada, Kariya, JP;
DENSO CORPORATION, Kariya, JP;
Abstract
The abnormality determination apparatus, which is for determining presence of an abnormality in an angle detection device configured to output an output signal having a value equivalent to a rotational angle of a rotating body, includes a smoothing device configured to receive the output signal of the angle detection device to smooth a dependent variable of a function whose independent variable is the rotational angle equivalent value, and a parameter calculation device for calculating an abnormality determination parameter based on the dependent variable smoothed by the smoothing device. The function is such that an integrated value of the rotational angle equivalent value over a predetermined time section is always positive or negative, and is configured to vary the dependent variable continuously in accordance with continuous variation of the independent variable in at least a part of the predetermined time section.