The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Sep. 24, 2009
Applicants:

Hideyuki Tsuchikiri, Tokyo, JP;

Yasushi Sato, Tokyo, JP;

Jiro Aihara, Tokyo, JP;

Inventors:

Hideyuki Tsuchikiri, Tokyo, JP;

Yasushi Sato, Tokyo, JP;

Jiro Aihara, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 17/00 (2006.01); G01F 7/00 (2006.01); B60S 5/00 (2006.01); G07C 5/08 (2006.01); B60R 25/00 (2013.01);
U.S. Cl.
CPC ...
G07C 5/0808 (2013.01); B60R 25/00 (2013.01); G07C 5/085 (2013.01);
Abstract

Data during normal driving is generated using travel data during the occurrence of a failure or the like, the travel data being accumulated into ordinary vehicles traveling in a city or other places on a daily basis. A failure diagnosis of a vehicle is performed by comparing a reference value with the time sequence electronic control unit (ECU) data of a plurality of driving parameters during the occurrence of a failure, the data being stored into a storage device in the ECU of the vehicle when a failure of the vehicle has occurred. The time sequence ECU data obtained from a large number of vehicles are sequentially accumulated and stored and the numerical vectors of the accumulated time sequence ECU data are generated. The numerical vectors are clustered and classified into a plurality of clusters according to the characteristics. In each of the plurality of clusters, a range of high occurrence rate values is obtained for the values of the respective driving parameters. The obtained range of high occurrence rate values is then stored as a range of the normal values of the driving parameters, and the range of the normal values is set as the reference value for a failure diagnosis.


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