The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Sep. 21, 2011
Applicants:

Andrea Boero, Genoa, IT;

Ignazio Selvaggio, Genoa, IT;

Inventors:

Andrea Boero, Genoa, IT;

Ignazio Selvaggio, Genoa, IT;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/00 (2006.01); G06Q 10/06 (2012.01); G05B 23/02 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/06 (2013.01); G05B 23/0245 (2013.01); H01L 21/02381 (2013.01);
Abstract

A method models a defect management routine. Both the modeling and a handling are executed within a manufacturing execution system. During an engineering phase: modeling the production process and creating a library of possible defect types which may occur; assigning the defect types to at least one defect group; creating a library of defect specifications; creating a library of defect type specification details; creating at least one runtime defect criteria that is used to link the defect type to a certain production volume; and creating a runtime defect measurement routine that monitors a corrective measure. During a runtime production phase evaluating the product produced; identifying the respective defect type out of the library of defect types; and using the identified defect type to determine a corrective measure, a runtime defect criteria identifying the resource causing the defect type, a production volume, and to run the respective runtime defect management routine.


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