The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Jul. 25, 2012
Sebastian Randel, Aberdeen, NJ (US);
Jeffrey H. Sinsky, Marlboro, NJ (US);
Sebastian Randel, Aberdeen, NJ (US);
Jeffrey H. Sinsky, Marlboro, NJ (US);
Alcatel Lucent, Boulogne-Billancourt, FR;
Abstract
Disclosed herein are various embodiments of a time-domain reflectometer having a transmitter configured to apply, to a system under test (SUT), an intensity-modulated probe signal generated based on a periodic pseudo-random bit sequence. The reflectometer further has a receiver configured to receive, back from the SUT, a reflected signal corresponding to the probe signal. The receiver converts the received reflected signal into a binary bit sequence using a relatively simple slicer circuit, and without the use of complex analog circuits and/or multi-bit analog-to-digital converters. The binary bit sequence is then compared with the original pseudo-random bit sequence to obtain a measure of the impulse response of the SUT. In some embodiments, the reflectometer has a controllable noise generator that can be used, e.g., to optimize the obtained measure for the detection of multiple SUT defects having significantly differing reflection characteristics.