The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Jun. 20, 2011
Trung Duc Vo, Darlington, AU;
William Peter Corcoran, Dulwich Hill, AU;
Mark David Pelusi, Camperdown, AU;
David James Moss, Croydon, AU;
Benjamin John Eggleton, Camperdown, AU;
Jochen Bernhard Schroeder, Marrickville, AU;
Trung Duc Vo, Darlington, AU;
William Peter Corcoran, Dulwich Hill, AU;
Mark David Pelusi, Camperdown, AU;
David James Moss, Croydon, AU;
Benjamin John Eggleton, Camperdown, AU;
Jochen Bernhard Schroeder, Marrickville, AU;
The University of Sydney, New South Wales, AU;
Abstract
This invention concerns real-time multi-impairment signal performance monitoring. In particular it concerns an optical device, for instance a monolithic integrated photonics chip, comprising a waveguide having an input region to receive a signal for characterization, and a narrow band CW laser signal. A non-linear waveguide region to mix the two received signals. More than one output region, each equipped with bandpass filters that extract respective discrete frequency bands of the RF spectrum of the mixed signals. And, also comprising (slow) power detectors to output the extracted discrete frequency banded signals.