The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Jan. 13, 2012
Raja Bala, Webster, NY (US);
Zhigang Fan, Webster, NY (US);
Hengzhou Ding, Webster, NY (US);
Jan P. Allebach, West Lafayette, IN (US);
Charles A. Bouman, West Lafayette, IN (US);
Reuven J. Sherwin, Ra'anana, IL;
Raja Bala, Webster, NY (US);
Zhigang Fan, Webster, NY (US);
Hengzhou Ding, Webster, NY (US);
Jan P. Allebach, West Lafayette, IN (US);
Charles A. Bouman, West Lafayette, IN (US);
Reuven J. Sherwin, Ra'anana, IL;
XEROX CORPORATION, Norwalk, CT (US);
Abstract
As set forth herein, a computer-implemented method facilitates pre-analyzing an image and automatically suggesting to the user the most suitable regions within an image for text-based personalization. Image regions that are spatially smooth and regions with existing text (e.g. signage, banners, etc.) are primary candidates for personalization. This gives rise to two sets of corresponding algorithms: one for identifying smooth areas, and one for locating text regions. Smooth regions are found by dividing the image into blocks and applying an iterative combining strategy, and those regions satisfying certain spatial properties (e.g. size, position, shape of the boundary) are retained as promising candidates. In one embodiment, connected component analysis is performed on the image for locating text regions. Finally, based on the smooth and text regions found in the image, several alternative approaches are described herein to derive an overall metric for 'suitability for personalization.'