The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Aug. 30, 2012
Applicants:

Satoru Ohishi, Otawara, JP;

Yu-bing Chang, Wheeling, IL (US);

Inventors:

Satoru Ohishi, Otawara, JP;

Yu-Bing Chang, Wheeling, IL (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); A61B 6/12 (2006.01); A61F 2/06 (2013.01); G06K 9/00 (2006.01); A61B 6/03 (2006.01); A61F 2/82 (2013.01);
U.S. Cl.
CPC ...
A61F 2/06 (2013.01); G06K 9/00 (2013.01); A61B 6/03 (2013.01); A61B 6/12 (2013.01); A61F 2/82 (2013.01); A61F 2250/0098 (2013.01);
Abstract

According to one embodiment, an X-ray diagnostic apparatus includes a data acquiring unit and a data processing unit. The data acquiring unit acquires X-ray projection data corresponding to plural directions from an object in which a stent having markers has been inserted by exposing X-rays to the object from the plural directions. The data processing unit obtains a spatial position corresponding to at least one marker out of the markers based on first three dimensional image data generated by first image reconstruction processing of the X-ray projection data to generate second three dimensional image data by second image reconstruction processing of the X-ray projection data with a correction using a shift amount obtained based on the X-ray projection data and projected data of the one marker on a projected plane of the X-ray projection data.


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