The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Apr. 19, 2011
Kazunori Fukuda, Fujisawa, JP;
Kazuhiro Takada, Kawasaki, JP;
Taihei Mukaide, Yokohama, JP;
Masatoshi Watanabe, Isehara, JP;
Kazunori Fukuda, Fujisawa, JP;
Kazuhiro Takada, Kawasaki, JP;
Taihei Mukaide, Yokohama, JP;
Masatoshi Watanabe, Isehara, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
To provide an X-ray imaging apparatus capable of easily adjusting the sensitivity or capable of easily extracting the amount of refraction of X-rays. An X-ray imaging apparatus irradiating an object to be measured with an X-ray beam from an X-ray source that generates X-rays of a first energy and X-rays of a second energy different from the first energy to measure an image of the object to be measured includes an attenuator and a detector. The attenuator attenuates the X-ray beam transmitted through the object to be measured and is configured so as to vary the amount of attenuation of the X-rays depending on a position on which the X-ray beam is incident. The detector detects the X-ray beam transmitted through the attenuator and is configured so as to detect the X-rays of the first energy and the second energy.