The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Mar. 09, 2006
Applicants:

Raghuraman Krishnamoorthi, San Diego, CA (US);

Fuyun Ling, San Diego, CA (US);

Rajiv Vijayan, San Diego, CA (US);

Inventors:

Raghuraman Krishnamoorthi, San Diego, CA (US);

Fuyun Ling, San Diego, CA (US);

Rajiv Vijayan, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04L 27/26 (2006.01);
U.S. Cl.
CPC ...
H04L 27/2644 (2013.01);
Abstract

Systems and methods are provided for transmitting OFDM information via IFFT up-sampling components that transmit data at a higher sampling rate than conventional systems to simplify filter requirements and mitigate leakage between symbols. In one embodiment, an NL point IFFT is performed on a zero inserted set of frequency domain symbols. In another embodiment, the NL point IFFT is further optimized by exploiting the fact that (N−1) L of the frequency domain symbols are zero. This enables an embodiment that consists of a pre-processor that multiplies the input samples by complex phase factors, followed by L point IFFTs.


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