The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Nov. 01, 2007
Applicants:

Dean V. Dang, Fountain Valley, CA (US);

Kek Ming Chua, Rancho Santa Margarita, CA (US);

King S. Goh, Las Flores, CA (US);

Prakash Balasubramaniam, Lake Forest, CA (US);

Ming Jin, Lake Forest, CA (US);

Inventors:

Dean V. Dang, Fountain Valley, CA (US);

Kek Ming Chua, Rancho Santa Margarita, CA (US);

King S. Goh, Las Flores, CA (US);

Prakash Balasubramaniam, Lake Forest, CA (US);

Ming Jin, Lake Forest, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01); G11B 5/09 (2006.01); G11B 5/596 (2006.01); G11B 20/18 (2006.01); G11B 20/12 (2006.01);
U.S. Cl.
CPC ...
G11B 20/1816 (2013.01); G11B 2020/183 (2013.01); G11B 2020/1282 (2013.01);
Abstract

A disk drive is disclosed including a disk having a plurality of sectors, and a head actuated over the disk. A defect threshold is initialized, and a first sector is read to generate a first read signal. The first read signal is processed to detect a defect in the first sector relative to the defect threshold. After detecting the defect, the defect threshold is adjusted and the first sector is reread to generate a second read signal. The second read signal is processed to detect the defect in the first sector relative to the adjusted defect threshold.


Find Patent Forward Citations

Loading…