The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Mar. 28, 2013
Applicant:

Nalux Co., Ltd., Osaka-shi, Osaka, JP;

Inventors:

Tomohito Kuwagaito, Osaka, JP;

Yosuke Sakohira, Osaka, JP;

Daisuke Seki, Osaka, JP;

Assignee:

NALUX CO., LTD., Osaka-shi, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); G02B 3/00 (2006.01); G02B 3/06 (2006.01); G02B 26/12 (2006.01); G02B 1/04 (2006.01);
U.S. Cl.
CPC ...
G02B 3/00 (2013.01); G02B 1/043 (2013.01); G02B 3/06 (2013.01); G02B 26/125 (2013.01);
Abstract

The method includes the steps of: obtaining lateral magnification of an optical scanning system; obtaining the maximum value of thickness in the optical axis direction of an scanner lens; obtaining allowance b on one side and beam diameter a in the vertical scanning direction in the lens; and obtaining width h in the vertical scanning direction of the lens by the following expression2 The allowance b is a product of the maximum value of thickness in the optical axis direction of the lens and a coefficient, and the coefficient is determined according to the lateral magnification of the system in such a way that the maximum value of movement of the focal point of the lens due to moisture absorption is made smaller than or equal to a predetermined value.


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