The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
May. 15, 2012
Applicants:
Masashi Kanai, Azumino, JP;
Yoshifumi Arai, Matsumoto, JP;
Inventors:
Masashi Kanai, Azumino, JP;
Yoshifumi Arai, Matsumoto, JP;
Assignee:
SEIKO EPSON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); G01N 33/02 (2006.01); G01N 21/25 (2006.01); G01N 21/27 (2006.01); G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01N 33/025 (2013.01); G01N 21/251 (2013.01); G01N 21/274 (2013.01); G01N 2021/3196 (2013.01);
Abstract
An estimation device is configured to estimate a feature value of a specific component contained in a sample and includes: a spectral estimation parameter storage module; a calibration parameter storage module; a multiband image acquirer; an optical spectrum operator configured to compute an optical spectrum from a multiband image using a spectral estimation parameter; and a calibration processor configured to compute the feature value from the optical spectrum using a calibration parameter.