The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Jan. 26, 2011
Applicants:
Hongqin Zhang, San Jose, CA (US);
Shizhe Shen, San Jose, CA (US);
Michael Divincent, Discovery Bay, CA (US);
Chong Yip Chow, Fremont, CA (US);
Inventors:
Hongqin Zhang, San Jose, CA (US);
Shizhe Shen, San Jose, CA (US);
Michael DiVincent, Discovery Bay, CA (US);
Chong Yip Chow, Fremont, CA (US);
Assignee:
Apple Inc., Cupertino, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 17/02 (2006.01); H04N 5/253 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); H04N 17/02 (2013.01);
Abstract
An operator friendly camera testing module is described. The camera testing module includes at least a color shift evaluation unit and a color non-uniformity evaluation unit. The color shift evaluation unit providing a color shift metric and the color non-uniformity evaluation unit providing a color non-uniformity metric each used to characterize a digital camera.