The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Nov. 30, 2012
Applicant:
The United States of America As Represented BY the Secretary of the Navy, Washington, DC (US);
Inventor:
Justin Henrie, Camarillo, CA (US);
Assignee:
The United States of America as Represented by the Secretary of the Navy, Washington, DC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01);
Abstract
A dynamic antenna pattern measurement method. Embodiments of the invention provide for nanosecond or better time resolution and milliradian angular resolution of the dynamic radiation pattern of an antenna under test over the predetermined solid angle scan (up to 4 π steradians) of the dynamic radiation pattern.
Henrie, Justin. (2015). Dynamic antenna pattern measurement method (U.S. Patent No. 9041610). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9041610
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile