The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Jan. 16, 2013
Applicant:

Hrl Laboratories, Llc, Malibu, CA (US);

Inventors:

Daniel J. Gregoire, Thousand Oaks, CA (US);

Joseph S. Colburn, Malibu, CA (US);

Assignee:

HRL Laboratories, LLC, Malibu, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); G01N 3/00 (2006.01); G01N 22/02 (2006.01); H01Q 13/20 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01N 3/00 (2013.01); G01N 22/02 (2013.01); H01Q 13/20 (2013.01); G01M 99/00 (2013.01);
Abstract

A system for measuring properties of a surface under test with surface waves includes a surface wave network including a dielectric substrate, a reactive grid of a plurality of metallic patches on a first surface of the dielectric substrate, a plurality of electronic nodes on the first surface of the dielectric substrate, and a ground plane on a second surface of the dielectric substrate permeable to RF fields of the surface waves, and a controller configured for causing a respective one of the electronic nodes to transmit at least one surface wave and configured for collecting data for signals received by at least one other of the plurality of electronic nodes.


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