The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Dec. 01, 2010
Applicants:

Aaron Joseph Ptak, Littleton, CO (US);

Yong Lin, Albuquerque, NM (US);

Andrew Norman, Evergreen, CO (US);

Kirstin Alberi, Denver, CO (US);

Inventors:

Aaron Joseph Ptak, Littleton, CO (US);

Yong Lin, Albuquerque, NM (US);

Andrew Norman, Evergreen, CO (US);

Kirstin Alberi, Denver, CO (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 33/26 (2010.01); H01L 21/02 (2006.01); C30B 23/02 (2006.01); C30B 25/18 (2006.01); C30B 29/40 (2006.01); H01L 29/04 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0242 (2013.01); H01L 21/02439 (2013.01); H01L 21/02491 (2013.01); H01L 21/02521 (2013.01); H01L 21/0254 (2013.01); H01L 21/02543 (2013.01); H01L 21/02546 (2013.01); H01L 21/0256 (2013.01); H01L 21/02664 (2013.01); C30B 23/025 (2013.01); C30B 25/183 (2013.01); C30B 29/40 (2013.01); H01L 29/04 (2013.01);
Abstract

A method of producing semiconductor materials and devices that incorporate the semiconductor materials are provided. In particular, a method is provided of producing a semiconductor material, such as a III-V semiconductor, on a spinel substrate using a sacrificial buffer layer, and devices such as photovoltaic cells that incorporate the semiconductor materials. The sacrificial buffer material and semiconductor materials may be deposited using lattice-matching epitaxy or coincident site lattice-matching epitaxy, resulting in a close degree of lattice matching between the substrate material and deposited material for a wide variety of material compositions. The sacrificial buffer layer may be dissolved using an epitaxial liftoff technique in order to separate the semiconductor device from the spinel substrate, and the spinel substrate may be reused in the subsequent fabrication of other semiconductor devices. The low-defect density semiconductor materials produced using this method result in the enhanced performance of the semiconductor devices that incorporate the semiconductor materials.


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