The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Oct. 05, 2011
Applicants:
Haruo Shimada, Kanagawa, JP;
Yoshimasa Nakatani, Kanagawa, JP;
Yuka Noritake, Kanagawa, JP;
Inventors:
Assignee:
SHISEIDO COMPANY, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01); H01J 49/00 (2006.01); H01J 49/14 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0027 (2013.01); H01J 49/0009 (2013.01); H01J 49/14 (2013.01);
Abstract
There is provided an analysis method including the steps of forming a layer including a calibration reagent, that can generate ions by using a DART ion source apparatus, in a predetermined area of a sample, and performing mass spectrometry on the ions generated from an area of the sample including the layer by using DART or DESI while moving the sample having the layer formed therein.