The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Mar. 12, 2013
Mario Eichenseer, Hirschaid, DE;
Steffen Kappler, Effeltrich, DE;
Edgar Kraft, Forchheim, DE;
Björn Kreisler, Erlangen, DE;
Daniel Niederlöhner, Erlangen, DE;
Stefan Wirth, Erlangen, DE;
Mario Eichenseer, Hirschaid, DE;
Steffen Kappler, Effeltrich, DE;
Edgar Kraft, Forchheim, DE;
Björn Kreisler, Erlangen, DE;
Daniel Niederlöhner, Erlangen, DE;
Stefan Wirth, Erlangen, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method is disclosed for energy calibrating quantum-counting x-ray detectors in an x-ray installation including at least two x-ray systems turnable around a center of rotation. A target, for producing x-ray fluorescence radiation, is positioned between the first x-ray source and first x-ray detector and irradiated with x-radiation of the first x-ray source in such a way that x-ray fluorescence radiation which strikes the second x-ray detector from the target is produced by the x-radiation of the first x-ray source. The second x-ray detector is then energy calibrated by way of the x-ray fluorescence radiation of the target. The first x-ray detector can be energy calibrated in the same way with the aid of the x-radiation of the second x-ray source. With the proposed method, the x-ray detectors of a dual-source CT x-ray installation can be calibrated with little expenditure under conditions close to those of the system.