The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Dec. 19, 2013
Applicant:

Optos Plc, Dunfermline, GB;

Inventors:

Gonzalo Muyo, Edinburgh, GB;

Derek Swan, Fife, GB;

Assignee:

OPTOS PLC, Dunfermline, GB;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/12 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
A61B 3/12 (2013.01); A61B 3/0025 (2013.01); A61B 3/14 (2013.01);
Abstract

This disclosure is directed to systems and methods for determining a correction for distortion in eye representations of an ophthalmoscope. A digital model of an optical system including the ophthalmoscope and a model eye may be constructed. The digital model may be transmitted to a ray tracing system. A ray may be passed through the optical system onto a surface of the model eye. A measurement of the ray at the surface of the model eye, with distortion, may be calculated and an angular position of a horizontal scanning element and an angular position of a vertical scanning element can be determined. Using the horizontal scanning angle and vertical scanning angle, a measurement of the ray at the surface of the model eye, without distortion, may be calculated and compared to the measurement with distortion to determine a correction for distortion in eye representations of the ophthalmoscope.


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