The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Dec. 22, 2011
Applicants:

Karl M. Gruca, Jr., Palm Beach Gardens, FL (US);

Jeffrey A. Umbach, Palm Beach Gardens, FL (US);

Inventors:

Karl M. Gruca, Jr., Palm Beach Gardens, FL (US);

Jeffrey A. Umbach, Palm Beach Gardens, FL (US);

Assignee:

United Technologies Corporation, Hartford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/265 (2006.01); G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
G01N 29/048 (2013.01); G01N 2291/0289 (2013.01);
Abstract

A system is provided for inspecting a workpiece that includes a workpiece defect and a workpiece surface. The system includes a laser pointer connected to an ultrasonic inspection system. The ultrasonic inspection system includes an ultrasonic transducer that directs sound waves to the workpiece defect, where the sound waves contact the workpiece surface at a workpiece surface location. The laser pointer directs a laser beam against the workpiece surface to visually annunciate the workpiece surface location.


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