The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
Sep. 28, 2012
Honeywell International Inc., Morristown, NJ (US);
Douglas Allen Bell, Peoria, AZ (US);
Tim Felke, Glendale, AZ (US);
Douglas L. Bishop, Phoenix, AZ (US);
Jeff vanderZweep, Peoria, AZ (US);
HONEYWELL INTERNATIONAL INC., Morristown, NJ (US);
Abstract
A method for accumulating fault condition data from a hierarchical system is presented comprising monitoring an operation of a component with a computing node that includes a processor and a memory. The memory contains a configuration file comprising failure modes (FM), symptoms, tests that identify the symptoms and a corrective action for the symptom. The method further comprises populating at least one of the processor and the memory of the computing node with one or more standardized executable application modules (SEAM) and a workflow service. The one or more SEAMS is configured to create a fault condition record by collecting all FMs that manifest the symptom. For all FMs collected, a list of unique symptoms is produced. Further all tests that can identify the listed unique symptoms and all of the corrective actions associated with the FMs that manifest the symptom are determined from the memory device.