The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2015

Filed:

Apr. 06, 2012
Applicants:

Mark Alan Sturza, Encino, CA (US);

Donald Leimer, Rancho Palos Verdes, CA (US);

Inventors:

Mark Alan Sturza, Encino, CA (US);

Donald Leimer, Rancho Palos Verdes, CA (US);

Assignee:

CSR TECHNOLOGY, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03H 17/02 (2006.01); H03H 17/06 (2006.01);
U.S. Cl.
CPC ...
H03H 17/0279 (2013.01); H03H 17/0664 (2013.01); H03H 17/0277 (2013.01);
Abstract

A method is provided for decimating a digital signal by a factor of M and matching it to a desired channel bandwidth. The method applies the digital signal input samples to a (M−1) stage tapped delay line, downsamples the input samples and the output samples of each tapped delay line stage by a factor of M, and applies each of the M downsampled sample value streams to M allpass IIR filters, respectively. The M allpass IIR filtered sample streams are then summed and scaled by a factor of 1/M. The result can then be filtered by a digital channel filter.


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