The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2015

Filed:

Dec. 13, 2013
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Miao Li, San Diego, CA (US);

Xiaohua Kong, San Diego, CA (US);

Nam Van Dang, San Diego, CA (US);

Cheng Zhong, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G01R 31/3177 (2006.01); G09G 5/00 (2006.01); G06F 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G09G 5/006 (2013.01); G09G 2350/00 (2013.01); G09G 2370/12 (2013.01); G06F 1/04 (2013.01);
Abstract

System and method for testing a high speed data path without generating a high speed bit clock, includes selecting a first high speed data path from a plurality of data paths for testing. Coherent clock data patterns are driven on one or more of remaining data paths of the plurality of data paths, wherein the coherent clock data patterns are in coherence with a low speed base clock. The first high speed data path is sampled by the coherent clock data patterns to generate a sampled first high speed data path, which is then tested at a speed of the low speed base clock.


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