The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
Jul. 06, 2010
Jason K. Wiggins, Draper, UT (US);
Kenneth E. Bertagnolli, Riverton, UT (US);
Gene Bogdanov, Manchester, CT (US);
Reinhold Ludwig, Paxton, MA (US);
Jason K. Wiggins, Draper, UT (US);
Kenneth E. Bertagnolli, Riverton, UT (US);
Gene Bogdanov, Manchester, CT (US);
Reinhold Ludwig, Paxton, MA (US);
US SYNTHETIC CORPORATION, Orem, UT (US);
Abstract
Embodiments of the invention relate to electrical impedance tomography testing systems and methods for non-destructively testing a polycrystalline diamond element (e.g., a polycrystalline diamond table of a polycrystalline diamond compact or a freestanding polycrystalline diamond table) using electrical impedance tomography to locate one or more high-electrical-conductivity regions (e.g., one or more regions of poorly sintered diamond crystals and/or high-metal-solvent catalyst content) and/or one or more low-electrical-conductivity regions (e.g., porosity and/or cracks) in the tested polycrystalline diamond element. Further embodiments relate to a rotary drill bit including at least one polycrystalline diamond compact that has been selectively positioned so that one or more high-electrical-conductivity regions of a polycrystalline diamond table thereof identified using the non-destructive testing systems and methods disclosed herein are not positioned to engage a subterranean formation during drilling.