The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
Jan. 27, 2012
Kevin J. Jones, Mechanicsville, VA (US);
Johannes J. M. DE Koning, Glen Allen, VA (US);
Geoffrey J. Parnell, Moseley, VA (US);
Kevin J. Jones, Mechanicsville, VA (US);
Johannes J. M. de Koning, Glen Allen, VA (US);
Geoffrey J. Parnell, Moseley, VA (US);
Flexicell Inc., Ashland, VA (US);
Abstract
A leak detection system and method are characterized by scanning a surface of a vacuum package, generating a contour signal corresponding with the contour of the scanned surface, and comparing the contour signal with a stored contour signal of a similar package which is known to be free of leaks. The system includes a sensor such as a scanning device which scans a surface of the package and generates the contour signal. A signal processor connected with the scanning device processes the signal to generate a profile of the package surface. This profile is compared with a stored profile corresponding to a normal configuration for the package surface. When the scanned profile deviates from the stored profile, a leak within the scanned package is indicated.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile