The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2015

Filed:

Aug. 22, 2011
Applicants:

Ryosuke Takahashi, Kanagawa, JP;

Tomoyuki Ito, Kanagawa, JP;

Kiyoshi Hosoi, Kanagawa, JP;

Takashi Ogino, Kanagawa, JP;

Inventors:

Ryosuke Takahashi, Kanagawa, JP;

Tomoyuki Ito, Kanagawa, JP;

Kiyoshi Hosoi, Kanagawa, JP;

Takashi Ogino, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/00 (2006.01); G01L 5/00 (2006.01);
U.S. Cl.
CPC ...
G01L 5/0047 (2013.01);
Abstract

An internal residual stress calculating device includes a prediction unit that predicts a temporal variation in deformation which is received by a medium having an image formed thereon from a correcting device correcting a deformation, and a calculation unit that calculates an internal residual stress of the medium having passed through the correcting device on the basis of a relational expression including an elasticity term and a term related to a plastic deformation and the temporal variation in deformation predicted by the prediction unit.


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