The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
Sep. 12, 2011
Ming-chang Tsai, San Diego, CA (US);
Pawan K. Baheti, Bangalore, IN;
Murali R. Chari, San Diego, CA (US);
Raghuraman Krishnamoorthi, San Diego, CA (US);
Ming-Chang Tsai, San Diego, CA (US);
Pawan K. Baheti, Bangalore, IN;
Murali R. Chari, San Diego, CA (US);
Raghuraman Krishnamoorthi, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
A repeated integral images method filters image data in only two passes, e.g., the first pass filters horizontal rows of pixels and a second pass filters vertical columns of pixels, or in a single pass. The filter performs at least one infinite impulse response (IIR) filter and at least one finite impulse response (FIR) filter on the image data. A plurality of IIR filters and FIR filters maybe performed to approximate a Gaussian filter. By minimizing the number of passes, the data flow between the processing unit and the storage unit is greatly reduced compared to conventional repeated integral images method thereby improving computation time.