The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
May. 17, 2012
Munetoshi Imada, Osaka, JP;
Hirokatsu Mizukusa, Osaka, JP;
Toshihiko Iwatani, Osaka, JP;
Hiroyasu Koshimizu, Nagoya, JP;
Takayuki Fujiwara, Ebetsu, JP;
Munetoshi Imada, Osaka, JP;
Hirokatsu Mizukusa, Osaka, JP;
Toshihiko Iwatani, Osaka, JP;
Hiroyasu Koshimizu, Nagoya, JP;
Takayuki Fujiwara, Ebetsu, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Toyo Tire & Rubber Co., Ltd., Osaka, JP;
Abstract
Provided is a tire defect detection method capable of accurately detecting a thinly extending convex defect of a tire surface. Prior to the start of Step S, two-dimensional images including a slit light image are successively obtained in advance. In Step S, a slit light image is extracted from data of a plurality of shot two-dimensional images. In Step S, an eccentricity component which is deviation resulting from eccentricity is eliminated from the extracted slit light image. In Step S, a feature quantity is calculated based on the light image from which the eccentricity component is eliminated, and in Step S, a thinly extending convex defect is detected based on the calculated feature quantity.