The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
Dec. 31, 2012
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Michael Christopher Domke, Skaneateles, NY (US);
Thomas Eldred Lambdin, Auburn, NY (US);
Jason Howard Messinger, Andover, MA (US);
Charles Burton Theurer, Alplaus, NY (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G01N 27/60 (2006.01); G01N 29/44 (2006.01); G01N 23/04 (2006.01); G01N 27/90 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01N 27/60 (2013.01); G01N 29/44 (2013.01); G01N 23/04 (2013.01); G01N 27/90 (2013.01);
Abstract
Systems and methods for entering data acquired from a non-destructive testing (NDT) system may include obtaining information related to an inspection using a non-destructive testing (NDT) inspection device. After obtaining the information, the method may include generating an inspection template, a report, metadata, or any combination thereof based on the information related to the inspection.