The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
Sep. 12, 2012
Norman Haas, Mount Kisco, NY (US);
Ying LI, Mohegan Lake, NY (US);
Charles A. Otto, Lansing, NY (US);
Sharathchandra Pankanti, Darien, CT (US);
Yuichi Fujiji, Houston, TX (US);
Hoang Trinh, Bothell, WA (US);
Norman Haas, Mount Kisco, NY (US);
Ying Li, Mohegan Lake, NY (US);
Charles A. Otto, Lansing, NY (US);
Sharathchandra Pankanti, Darien, CT (US);
Yuichi Fujiji, Houston, TX (US);
Hoang Trinh, Bothell, WA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A global position of an observed object is determined by obtaining a first global position of an observed object with at least one positioning device. A determination is made as to whether a set of stored visual characteristic information of at least one landmark matches a visual characteristic information set obtained from at least one captured image comprising a scene associated with the observed object. In response to the set of stored visual characteristic information matching the obtained visual characteristic information set, a second global position of the observed object is determined based on a set of stored location information associated with the at least one landmark and the first global position.