The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2015

Filed:

Apr. 04, 2011
Applicants:

Christian David, Lauchringen, DE;

Marco Stampanoni, Endingen, CH;

Inventors:

Christian David, Lauchringen, DE;

Marco Stampanoni, Endingen, CH;

Assignee:

Paul Scherrer Institut, Villigen PSI, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/04 (2006.01); G21K 1/02 (2006.01); G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); A61B 6/4035 (2013.01); A61B 6/4291 (2013.01); A61B 6/484 (2013.01); A61B 6/502 (2013.01); G21K 1/025 (2013.01); G21K 1/06 (2013.01); G21K 2201/067 (2013.01); G21K 2207/005 (2013.01);
Abstract

An X-ray arrangement is suitable to record absorption, phase contrast, and dark field images of an object. The visibility of low absorbing specimens is improved and required radiation dose is reduced. The assembly includes an X-ray source; two or more gratings; a position-sensitive detector with spatially modulated detection sensitivity; a recorder for recording the images; an evaluator for evaluating the intensities for each pixel to identify the characteristic of the object for each individual pixel as an absorption and/or a differential phase contrast and/or an x-ray scattering dominated pixel. Images are collected by rotating from 0 to n or 2n either the sample or the assembly. The gratings are produced with planar geometry. The X-rays pass through the gratings parallel to the substrate. The grating structures extend along the X-ray path which determines the phase shift. The attenuation of the X-rays caused by the grating structures is no longer given by the thickness, but by the length of the grating structures.


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