The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
Mar. 10, 2014
Fci Inc., Sungnam, Gyeonggi-Do, KR;
Byung Su Kang, Sungnam, KR;
FCI Inc., Sungnam, Gyeonggi-Do, KR;
Abstract
Disclosed is a method for adjusting FFT window of OFDM system. The method is categorized two scenarios when the maximum delay length of the channel is shorter than the guard interval length and when the maximum delay length of the channel is longer than the guard interval length. In respective scenarios, the method comprises steps: Step A, multiplying the guard interval (A1) damaged due to the path fading channel delay by a weighted value (α); Step B, multiplying the guard interval (A2) not damaged due to the path fading channel delay by a weighted value (1-α); and Step C, Adding the guard intervals of Step A and Step B together (A3) to be inputted into FFT; minimizing the inter-symbol interference, the inter-channel interference and the noise.