The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
May. 29, 2009
Ryuji Funayama, Yokohama, JP;
Shinya Kawamata, Gotemba, JP;
Yasukata Yokochi, Susono, JP;
Masato Endo, Susono, JP;
Yasuhiro Yoshida, Susono, JP;
Kenichi Kitahama, Nagoya, JP;
Ryuji Funayama, Yokohama, JP;
Shinya Kawamata, Gotemba, JP;
Yasukata Yokochi, Susono, JP;
Masato Endo, Susono, JP;
Yasuhiro Yoshida, Susono, JP;
Kenichi Kitahama, Nagoya, JP;
TOYOTA JIDOSHA KABUSHIKI KAISHA, Toyota-shi, JP;
Abstract
Disclosed is a spectrum measuring apparatus for shortening such a measurement time period for an object being measured including two or more mutually different measurement portions as is required for the spectrum measurements of the lights from individual measurement portions. The spectrum measuring apparatus comprises a slit group having two or more slits, a spectroscope for separating the lights extracted by the slit group, for the individual slits, and a measuring unit for measuring the intensities of the individual components, which are separated by the spectroscope, for the slits. The individual slits extract such ones of the lights coming from an object being measured including two or more mutually different measurement portions, as come from the individual measurement portions.