The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
Sep. 10, 2010
Nenad Mihajlovic, Eindhoven, NL;
Jeroen Jan Lambertus Horikx, Eindhoven, NL;
Waltherus Cornelis Jozef Bierhoff, Eindhoven, NL;
Cornelius Antonius Hezemans, Nuenen, NL;
Bernardus Hendrikus Wilhelmus Hendriks, Eindhoven, NL;
Nenad Mihajlovic, Eindhoven, NL;
Jeroen Jan Lambertus Horikx, Eindhoven, NL;
Waltherus Cornelis Jozef Bierhoff, Eindhoven, NL;
Cornelius Antonius Hezemans, Nuenen, NL;
Bernardus Hendrikus Wilhelmus Hendriks, Eindhoven, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
An optical probe system having a probe with an optical guide (G) having a distal end. The optical guide (G) is mounted inside a housing (H) so that the distal end is displaceable with respect to the housing (H). A set of actuators (A), e.g. electromagnetic drive coils, can displace the distal end by application of a drive signal (V, V). A control unit (CU) generates the drive signal (V, V) so as to provide a scanning frequency which varies according to an amplitude of the drive signal (V, V). With such probe system it is possible to scan a field of view with a scanning frequency that varies with the scanning radius. Taking into account the maximum allowable drive current, it is possible to increase scanning speed compared to scanning at the mechanical resonance frequency of the optical system, since small radii can be scanned at a high scanning frequency.