The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2015

Filed:

Aug. 15, 2007
Applicants:

Justin Michael Mahan, Fremont, CA (US);

Christopher J. Mills, Saratoga, CA (US);

Edward A. Hutchins, Mountain View, CA (US);

Inventors:

Justin Michael Mahan, Fremont, CA (US);

Christopher J. Mills, Saratoga, CA (US);

Edward A. Hutchins, Mountain View, CA (US);

Assignee:

NVIDIA CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/80 (2006.01); G06T 1/20 (2006.01); G05B 11/01 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/34 (2013.01); G06T 1/20 (2013.01);
Abstract

An efficient pipeline debug statistics system and method are described. In one embodiment, an efficient pipeline debug is utilized in a graphics processing pipeline of a handheld device. In one embodiment, a pipeline debug statistics system includes a plurality of pipeline stages with probe points, a central statistic component, and a debug control component. The plurality of pipeline stages with probe points perform pipeline operations. The central statistic block gathers information from the probe points. The debug control component directs the gathering of information from the probe points. In one exemplary implementation, debug control component can direct gathering of information at a variety of levels and abstraction.


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