The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
Jul. 05, 2012
Bangalore Aswatha Nagaraj, West Chester, OH (US);
Douglas Gerard Konitzer, West Chester, OH (US);
Julie Marie Chapman, Hamilton, OH (US);
Venkat Subramaniam Venkataramani, Clifton Park, NY (US);
Bangalore Aswatha Nagaraj, West Chester, OH (US);
Douglas Gerard Konitzer, West Chester, OH (US);
Julie Marie Chapman, Hamilton, OH (US);
Venkat Subramaniam Venkataramani, Clifton Park, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
Coating systems and processes by which the coating systems can be deposited to be resistant to contaminants, and particularly resistant to infiltration and damage caused by CMAS. The coating systems include inner and outer ceramic layers. The inner ceramic layer consists essentially of zirconia stabilized by about 6 to about 9 weight percent yttria and optionally contains greater than 0.5 to 10 weight percent hafnium oxide. The outer ceramic layer overlies and contacts the inner ceramic layer to define the outermost surface of the coating system. The outer ceramic layer consists essentially of zirconia stabilized by about 25 to about 75 weight percent yttria, has a thickness that is less than the thickness of the inner ceramic layer and further contains greater than 0.5 to 10 weight percent hafnium oxide and optionally 1 to 10 weight percent tantalum oxide. The outer ceramic layer has a porosity level that is lower than that of the inner ceramic layer.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile