The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2015

Filed:

Aug. 29, 2012
Applicants:

Andrew P. Bartko, Columbus, OH (US);

Johnway Gao, Federal Way, WA (US);

Inventors:

Andrew P. Bartko, Columbus, OH (US);

Johnway Gao, Federal Way, WA (US);

Assignee:

Battelle Memorial Institute, Columbus, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 10/00 (2006.01); G01N 35/00 (2006.01); G01N 1/31 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00029 (2013.01); G01N 1/312 (2013.01);
Abstract

A sample is cleaned up for spectroscopic analysis by receiving a slide substrate having the sample thereon, fixing the sample to a substrate surface of the slide substrate by applying heat to the slide substrate for a predetermined heating time and incubating the sample on the slide substrate for a predetermined incubation time after fixing the sample to the slide substrate. The sample is further cleaned by washing the sample on the slide substrate after the sample has been incubated and drying the sample by applying heat to the slide substrate for a predetermined drying time, wherein the sample on the slide substrate after drying has retained particles of interest and interferant particles are removed from the substrate. A substrate is also provided for sample collection, which is culturable and Raman silent.


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