The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2015

Filed:

Feb. 15, 2011
Applicants:

Christof Donitzky, Eckental/Eschenau, DE;

Klaus Vogler, Eckental/Eschenau, DE;

Christian Wuellner, Moehrendorf, DE;

Claudia Gorschboth, Nuremberg, DE;

Michael Mrochen, Eglisau, CH;

Inventors:

Christof Donitzky, Eckental/Eschenau, DE;

Klaus Vogler, Eckental/Eschenau, DE;

Christian Wuellner, Moehrendorf, DE;

Claudia Gorschboth, Nuremberg, DE;

Michael Mrochen, Eglisau, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/14 (2006.01); A61B 3/12 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/1225 (2013.01); A61B 5/0066 (2013.01);
Abstract

There is provided an apparatus for recording a depth profile of a biological tissue, in particular a frontal eye section of a human eye, according to the principle of optical coherence tomography, comprising a light source adapted to generate a bundle of light rays, an interferometer arrangement having a beam splitter device adapted to spatially separate the bundle of light rays into a reference beam and a measurement beam directed toward the tissue, a reference beam deflection device adapted to deflect the reference beam, a beam superpositioning device adapted to spatially superimpose the deflected reference beam onto the measurement beam deflected by the tissue into a superpositioned beam, and a detector arrangement for detecting information in the superpositioned beam associated with the difference of the optical path length of the reference beam and the measurement beam.


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